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Fizika Tverdogo Tela, 2021 Volume 63, Issue 6, Page 729 (Mi ftt10143)

This article is cited in 1 paper

Semiconductors

High-pressure Si phases and the mutual orientation of their structures. HRTEM studies

T. Gordeevaab, B. Kulnitskiyab, M. Popovab, D. Ovsyannikovab, V. Blankab

a Technological Institute for Superhard and Novel Carbon Materials, Centralnaya 7a, Troitsk, Moscow 142190, Russian Federation
b Moscow Institute of Physics and Technology State University, Institutskiy per. 9, Dolgoprudny 141700, Russian Federation

Abstract: As a result of high-resolution transmission electron microscopy (HRTEM) studies of silicon processed in a planetary mill in the presence of diamond powder, high-pressure phases were found: Si-III, Si-IV and Si-IX; moreover, a Si-IX particle with a length of more than 10 nm was detected by TEM methods for the first time. A study of the mutual orientations of the phases obtained allowed us to propose a scheme of transformations in silicon under pressure. We have shown that the Si-IX phase can be formed from Si-IV. The orientation relationship between Si-IV and Si-IX is established.

Keywords: silicon, transmission electron microscopy, plastic deformation, planetary mill, phase transformation.

Received: 12.12.2020
Revised: 22.12.2020
Accepted: 23.12.2020

Language: English


 English version:
Physics of the Solid State, 2021, 63:6, 844–849


© Steklov Math. Inst. of RAS, 2024