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Fizika Tverdogo Tela, 2024 Volume 66, Issue 4, Pages 537–541 (Mi ftt10276)

Semiconductors

Creating NV$^-$-defects in silicon carbide 6$H$–SiC by irradiation with high-energy electrons

F. F. Murzakhanova, Yu. A. Uspenskayab, E. N. Mokhovb, O. P. Kazarovab, V. V. Kozlovskyc, V. A. Soltamovb

a Institute of Physics, Kazan Federal University, Kazan, Russia
b Ioffe Institute, St. Petersburg, Russia
c Peter the Great St. Petersburg Polytechnic University, St. Petersburg, Russia

Abstract: The possibility of creating negatively charged nitrogen-vacancy defects (NV$^-$) in crystals of hexagonal (6$H$) silicon carbide by irradiating the latter with high-energy electrons ($E$ = 2 MeV) and subsequent high-temperature annealing at $T$ = 900$^\circ$C was investigated. Using electron paramagnetic resonance (EPR) it was shown that SiC crystals contain triplet ($S$ = 1) centers of axial symmetry with fine structure parameters $D$ = 1344, 1318 and 1268 MHz. The corresponding components of the fine structure are split by a spectrally resolved hyperfine interaction with the nuclear spin of nitrogen ($^{14}$N, $I$ = 1), which is characterized by a hyperfine interaction constant $A\approx$ 1.23 MHz, which makes it possible to unambiguously identify the presence of NV$^-$-centers in the samples under study. It is shown that optical excitation by an IR laser $\lambda$ = 980 nm leads to the creation of an inverse population of the spin sublevels of these triplet centers, which is the basis for their use as quantum sensors, qubits and masers with optical pumping.

Keywords: electron paramagnetic resonance, silicon carbide, nitrogen-vacancy defect.

Received: 26.02.2024
Revised: 26.02.2024
Accepted: 27.02.2024

DOI: 10.61011/FTT.2024.04.57788.35



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