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Fizika Tverdogo Tela, 2024 Volume 66, Issue 10, Pages 1686–1698 (Mi ftt10447)

Semiconductors

Formation of ferromagnetic semiconductor GaMnAs by ion implantation: comparison of different types of annealing

O. V. Vikhrovaa, Yu. A. Danilova, Yu. A. Dudina, A. V. Zdoroveyshcheva, I. L. Kalentyevaa, A. V. Kudrina, R. N. Kriukova, A. V. Nezhdanova, A. E. Parafinb, M. K. Taperocd, M. P. Temiryazevae, A. G. Temiryazeve, A. A. Yakovlevaa

a National Research Lobachevsky State University of Nizhny Novgorod, Nizhny Novgorod, Russia
b Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhny Novgorod, Russia
c National University of Science and Technology «MISIS», Moscow, Russia
d Prokhorov General Physics Institute of the Russian Academy of Sciences, Moscow, Russia
e Kotelnikov Institute of Radioengineering and Electronics, Fryazino Branch, Russian Academy of Sciences

Abstract: The preparation of the ferromagnetic semiconductor GaMnAs by ion implantation and three types of annealing is considered: rapid thermal, pulsed laser, and combined annealing (a combination of rapid thermal and pulsed laser annealing). Rapid thermal annealing contributed to the improvement of crystallinity and the formation of clusters (including ferromagnetic ones at room temperature), and subsequent exposure to laser radiation led to their modification. When studying the structural, galvanomagnetic and magneto-optical properties, the formation of two ferromagnetic phases, differing in Curie temperature, was revealed in GaMnAs layers.

Keywords: ion implantation, rapid thermal annealing, pulsed laser annealing, two-phase ferromagnetic semiconductor.

Received: 16.06.2024
Revised: 26.09.2024
Accepted: 28.09.2024

DOI: 10.61011/FTT.2024.10.59073.195



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