$h$-BN surface modification by scanning probe microscope

The study demonstrates the possibility of modifying fragments of hexagonal boron nitride layers by bending them with a probe using a scanning probe microscope. The specific ranges of $h$-BN fragments with a lateral size of about 1 micron have been determined. It was possible to obtain a layer up to 8 monolayers thick from initially thick fragments of $h$-BN by the layer flip method.