Dielectrics
Effect of gamma-induced defects on the activator glow in Lu$_2$SiO$_5$ : Ce scintillator crystals
A. Kh. Islamova,
E. M. Ibragimovaa,
Kh. N. Kudratova,
R. R. Vil'danovb a Institute of Nuclear Physics, Academy of Sciences of Uzbekistan, Tashkent, Ulugbek Settlement, Uzbekistan
b National University of Uzbekistan named after M. Ulugbek, Tashkent, Uzbekistan
Abstract:
Correlations were studied between the optical absorption (OA) spectra and the integral curves of thermal glow (TG) in 300–600 K after irradiation of Lu
$_2$SiO
$_5$ : Ce scintillation crystals with
$^{60}$Co gamma-quanta (1.17 and 1.33 MeV) at the dose rate 1.1 Gy/s in the dose range 70–5
$\cdot$ 10
$^7$ Gy at 310 K and their gamma-luminescence (GL). There are intrinsic defects caused by technological process, such as neutral V
$_{\mathrm{O5}}$-centers with OA band at 193 nm and charged
$\equiv$ Si-V
$_{\mathrm{O5}}$ – 213 nm, Lu1–F
$^+$–Si – 238 nm, Ce
$^{3+}$/Ce
$^{4+}$ – 263 nm, and Ce
$^{3+}$/F – 295 nm centers. Irradiation to the dose 5
$\cdot$ 10
$^4$ Gy resulted in decreasing in V
$_{\mathrm{O5}}$-center concentration, but did not influenced on others. While, after doses
$>$ 5
$\cdot$ 10
$^4$ Gy concentrations of all other mentioned defects grew. The observed recovery of OA at 193 nm and decrease in TG peak at 335 K with the ageing time (1, 3 and 10 hours) at 305 K, and also the correlated growth of OA at 238 nm and TG peak at 540 K after serial irradiations to doses from 70 to 2.3
$\cdot$ 10
$^6$ Gy are due to releasing electrons from these color centers followed by radiative recombination at Ce1-centers. However Ρε
$^{3+}$ GL yield decrease at 400 and 420 nm at doses
$>$ 10
$^5$ Gy is possible related with increasing concentrations of
$\equiv$ Si–V
$_{\mathrm{O4}}$, Lu1–F
$^+$–Si and Ρε
$^{3+}$/F centers, which compete with Ce1 ones in trapping electrons. Thus, the upper limit for stable Lu
$_2$SiO
$_5$ : Ce gamma-scintillation is 10
$^5$ Gy.
Keywords:
Lu$_2$SiO$_5$ : Ce, color centers, gamma-induced luminescence, scintillation dose limit.
DOI:
10.21883/FTT.2022.11.53325.357