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Fizika Tverdogo Tela, 2015 Volume 57, Issue 6, Pages 1084–1086 (Mi ftt11517)

Semiconductors

Impedance spectra of doped bismuth silicate Bi$_{12}$SiO$_{20}$:Ge crystals

V. T. Avanesyan, N. M. Abramova

Herzen State Pedagogical University of Russia, St. Petersburg

Abstract: The specific features of the behavior of the impedance spectra of germanium-doped Bi$_{12}$SiO$_{20}$ single crystals with the sillenite structure have been studied. It has been found that the obtained dependences exhibit a dispersion corresponding to the distribution of the relaxation times. An analysis of the experimental data performed by the graphical-analytic method has made it possible to separate the contributions to the conductivity due to the crystal bulk and the sample-electrode interface. The role played by the impurity factor and lone electron pairs of trivalent bismuth ions in the formation of the defect structure of the crystal has been demonstrated.

Received: 23.12.2014


 English version:
Physics of the Solid State, 2015, 57:6, 1100–1102

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