RUS  ENG
Full version
JOURNALS // Fizika Tverdogo Tela // Archive

Fizika Tverdogo Tela, 2015 Volume 57, Issue 12, Pages 2304–2312 (Mi ftt11718)

This article is cited in 23 papers

Semiconductors

Correlations in infrared spectra of nanostructures based on mixed oxides

I. A. Averina, A. A. Karmanova, V. A. Moshnikovbc, I. A. Pronina, S. E. Igoshinaa, A. P. Sigaeva, E. I. Terukovd

a Penza State University
b Saint Petersburg Electrotechnical University "LETI"
c Peter the Great St. Petersburg Polytechnic University
d Ioffe Institute, St. Petersburg

Abstract: This paper has presented experimental data on the infrared spectroscopic investigation of nanostructures based on mixed oxides. Nanostructures in the form of porous thin films deposited on oxidized single- crystal silicon substrates have been synthesized by the sol–gel method. The qualitative composition of film-forming sols and the related nanostructures has been examined. Correlations relating the coefficient of transmission of infrared radiation through the materials under investigation and their quantitative composition have been established. The processes occurring during the annealing of the nanostructures in the temperature range from 100 to 600$^\circ$C have been analyzed.

Received: 30.04.2015
Accepted: 01.06.2015


 English version:
Physics of the Solid State, 2015, 57:12, 2373–2381

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2025