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Fizika Tverdogo Tela, 2014 Volume 56, Issue 3, Pages 431–434 (Mi ftt11914)

Semiconductors

Anisotropy of the EPR line shape of dislocation acceptor centers in semiconducting type Ic diamonds

S. N. Samsonenko

Donbas National Academy of Civil Engineering and Architecture

Abstract: The shape anisotropy of the EPR lines of broken carbon bonds in a dislocation core with an edge component in natural semiconducting type Ic diamonds has been investigated. It has been found that electrically active acceptor centers are formed at dislocation steps, jogs, or kinks. The distance between the paramagnetic centers is determined.

Received: 22.07.2013


 English version:
Physics of the Solid State, 2014, 56:3, 438–441

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