G. A. Komandin, O. E. Porodinkov, L. D. Iskhakova, I. E. Spektor, A. A. Volkov, K. A. Vorotilov, D. S. Seregin, A. S. Sigov, “Electrodynamic properties of lead zirconate-titanate thin films in the terahertz frequency range”, Fizika Tverdogo Tela, 2014, Volume 56, Issue 11,Pages <nobr>2135

This article is cited in 7 papers

Ferroelectricity

Electrodynamic properties of lead zirconate-titanate thin films in the terahertz frequency range

G. A. Komandin^a, O. E. Porodinkov^a, L. D. Iskhakova^b, I. E. Spektor^a, A. A. Volkov^a, K. A. Vorotilov^c, D. S. Seregin^c, A. S. Sigov^c

^a Prokhorov General Physics Institute of the Russian Academy of Sciences, Moscow
^b Fiber Optics Research Center of the Russian Academy of Sciences, Moscow
^c MIREA — Russian Technological University, Moscow

Abstract: The transmission/reflection spectra of bilayer structures consisting of thin amorphous and polycrystalline Pb(Zr$_{0.52}$Ti$_{0.48}$)O$_3$ ferroelectric films deposited on dielectric substrates of magnesium oxide MgO and sapphire $\alpha$-Al$_2$O$_3$ were measured in the frequency range of 5–4000 cm$^{-1}$. Based on these spectra and using the dispersion analysis method, the spectra of complex dielectric permittivity $\varepsilon^*(\nu)$ and dynamic conductivity $\sigma'(\nu)$ of the films were simulated, the electrodynamic parameters of the films were determined, and the dielectric dispersion responsible for the formation of static permittivity was found.