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Fizika Tverdogo Tela, 2013 Volume 55, Issue 1, Pages 14–18 (Mi ftt12272)

This article is cited in 6 papers

Semiconductors

Transport properties and polarization phenomena in intercalated Ag$_x$HfSe$_2$ compounds

V. G. Pleshcheva, N. V. Seleznevaa, N. V. Baranovab

a Institute of Natural Sciences, Ural Federal University named after the first President of Russia Boris Yeltsin, Ekaterinburg
b Institute of Metal Physics, Ural Branch of the Russian Academy of Sciences, Ekaterinburg

Abstract: The electrical properties of intercalated Ag$_x$HfSe$_2$ compounds ($x$ = 0.1, 0.2) have been investigated for the first time. Investigations have been performed using various current electrodes, which make it possible to pass either the electron current or the ion current across the sample. Polarization effects, which indicate the self-consistent migration of charge carriers in the samples, have been found for the samples at room temperature. Based on the characteristic features of polarization decay, coefficients of conjugated chemical diffusion have been evaluated.

Received: 23.04.2012


 English version:
Physics of the Solid State, 2013, 55:1, 21–25

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