Abstract:
Metallic Pd synthesized in porous glass with an average pore diameter of 7 $\pm$ 2 nm has been studied using the X-ray diffraction and X-ray line shift methods for the first time. The irregular dependence of the reflection width in X-ray patterns on the diffraction angle has been revealed. This can be caused by crystallite growth mostly in the [111] direction or by tetrahedral distortions of the fcc lattice. The shift (difference in energy) of $K_{\alpha1}$ lines ($\Delta E_{\alpha1}$ = 19 $\pm$ 2 meV) for nanostructured Pd in comparison with the bulk material is first detected. The detected effect is considered within the assumption of the palladium electron redistribution between Pd 5$s$- and 4$d$-bands.