RUS  ENG
Full version
JOURNALS // Fizika Tverdogo Tela // Archive

Fizika Tverdogo Tela, 2010 Volume 52, Issue 9, Pages 1717–1723 (Mi ftt13852)

This article is cited in 9 papers

Semiconductors and dielectrics

Dielectric spectra of Bi$_{0.98}$Nd$_{0.02}$FeO$_3$ multiferroic thin films in the terahertz frequency range

G. A. Komandina, V. I. Torgashevb, A. A. Volkova, O. E. Porodinkova, I. E. Spektora, V. M. Mukhortovb

a Prokhorov General Physics Institute of the Russian Academy of Sciences, Moscow
b Southern Federal University, Rostov-on-Don

Abstract: Transmission and reflection spectra of Bi$_{0.98}$Nd$_{0.02}$FeO$_3$ multiferroic thin films on MgO single-crystal substrates have been measured using submillimeter spectroscopy (on a backward-wave tube spectrometer) and Fourier-transform infrared spectroscopy in the frequency range from 8 to 1000 cm$^{-1}$ at room temperature. The complex permittivity spectra of the films have been calculated in terms of the layered medium model. It has been revealed that a decrease in the film thickness leads to a considerable increase in the losses in a range of 30 cm$^{-1}$ and the corresponding fivefold increase in the static permittivity (to 500 for a film 32 nm thick). This phenomenon has been discussed in the framework of the phenomenological theory of phase transitions.

Received: 21.12.2009


 English version:
Physics of the Solid State, 2010, 52:9, 1842–1849

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2026