E. A. Kravtsov, V. V. Ustinov, “Complementary application of neutron and synchrotron X-ray scattering to the determination of the magnetic microstructure of exchange-coupled layered nanoheterostructures”, Fizika Tverdogo Tela, 2010, Volume 52, Issue 11,Pages <nobr>2116

This article is cited in 5 papers

Proceedings of the XIV International Symposium ''Nanophysics and Nanoelectronics-2010'' (Nizhni Novgorod, Russia, March 15-19, 2010)
Magnetism and ferroelectricity

Complementary application of neutron and synchrotron X-ray scattering to the determination of the magnetic microstructure of exchange-coupled layered nanoheterostructures

E. A. Kravtsov^ab, V. V. Ustinov^a

^a Institute of Metal Physics, Ural Branch of the Russian Academy of Sciences, Ekaterinburg
^b Ural State Technical University, Ekaterinburg

Abstract: Complementary neutron and synchrotron X-ray scattering techniques have been considered as applied to the investigation of an inhomogeneous magnetic microstructure typical of exchange-coupled nanoheterostructures consisting of alternating ferromagnetic and antiferromagnetic metal layers. It has been demonstrated that changes in magnetic moments in both the magnitude and the direction within ferromagnetic layers can be determined by combining polarized neutron and resonant X-ray magnetic reflectometry, and those within antiferromagnetic layers, by combining X-ray and neutron diffractometry.