O. M. Zhigalina, D. N. Khmelenin, K. A. Vorotilov, A. S. Sigov, I. G. Lebo, “Electron microscopy of the barium strontium titanate film structure on Pt–Ti–SiO<nobr>$_2$</nobr>–Si substrates after laser annealing”, Fizika Tverdogo Tela, 2009, Volume 51, Issue 7,Pages <nobr>1398

This article is cited in 2 papers

Proceeding of the XVIII All-Russia Conference on Physics of Ferroelectrics (VKS-XVIII) (St. Petersburg, Russia, June 9-14, 2008)

Electron microscopy of the barium strontium titanate film structure on Pt–Ti–SiO$_2$–Si substrates after laser annealing

O. M. Zhigalina^a, D. N. Khmelenin^a, K. A. Vorotilov^b, A. S. Sigov^b, I. G. Lebo^b

^a Institute of Cristallography Russian Academy of Sciences, Moscow
^b Moscow State Institute of Radioengineering, Electronics, and Automation (Technical University), Moscow, 119454, Russia

Abstract: The effect of laser annealing on the structure of barium strontium titanate films prepared through chemical solution deposition has been investigated. It is demonstrated that the effect of laser radiation initiates processes of crystallization and recrystallization in the films and causes amorphization of the outer surface of the film.