Short Notes

X-ray diffuse scattering by microdefects in silicon prepared with Chohralski method

È. K. Kov'ev, V. T. Bublik, V. G. Postolov

Institute of Cristallography of the USSR Academy of Sciences, Moscow

UDC: 537.531

Received: 25.04.1984
Revised: 15.10.1984

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