Electron-paramagnetic-res and dlts comparative study of process of dislocation silicon dangling bond annealing

M. N. Zolotukhin, V. V. Kveder, Yu. A. Osip'yan, I. R. Sagdeev

Institute of Solid State Physics of the Academy of Sciences SSSR

UDC: 537.311.322

Received: 28.12.1983

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