High-voltage electron microscopy study of metal–semiconductor interface defect structure in $\mathrm{SmS}$

B. I. Smirnov, G. Kestner, A. V. Ryabov, I. A. Smirnov

Ioffe Physico-Technical Institute USSR Academy of Sciences, Leningrad

Received: 08.07.1982
Revised: 11.10.1982

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