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Fizika Tverdogo Tela, 1983 Volume 25, Issue 10, Pages 2930–2935 (Mi ftt4089)

Microscopic analysis of the elastic stress effect on displacive impurity atom migration in silicon

V. A. Panteleev, M. I. Vasilevskii, Yu. L. Kalinkin

Gor'kii State University named after N. I. Lobachevskogo

Received: 14.04.1983



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