On the possibility of using exoelectron emission for amorphous silicon film band structure analysis

R. Ya. Akmene, Ya. L. Gavardin, Yu. D. Dekhtyar, G. L. Sagalovich, E. A. Kazakova, A. Ya. Vinogradov

Ioffe Physico-Technical Institute USSR Academy of Sciences, Leningrad

UDC: 621.315.592

Received: 07.07.1988

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