V. V. Lider, F. N. Chukhovskii, Yu. P. Khapachev, M. N. Barashev, “X-ray diffraction study of distorted surface layers of <nobr>$\mathrm{Si} (111)$</nobr> and $\mathrm{In}_{0.5}\mathrm{Ga}_{0.5}\mathrm{P}/\mathrm{GaAs} (111)$ basing on the constant strain gradient model”, Fizika Tverdogo Tela, 1989, Volume 31, Issue 4,Pages <nobr>74

X-ray diffraction study of distorted surface layers of $\mathrm{Si} (111)$ and $\mathrm{In}_{0.5}\mathrm{Ga}_{0.5}\mathrm{P}/\mathrm{GaAs} (111)$ basing on the constant strain gradient model

V. V. Lider, F. N. Chukhovskii, Yu. P. Khapachev, M. N. Barashev

Institute of Cristallography of the USSR Academy of Sciences, Moscow

UDC: 548.732

Received: 10.10.1988