M. V. Kruglov, I. K. Solomin, “Effect of the total internal reflection of X-rays on the secondary emission yield”, Fizika Tverdogo Tela, 1986, Volume 28, Issue 8,Pages <nobr>2560

JOURNALS // Fizika Tverdogo Tela // Archive

Fizika Tverdogo Tela, 1986 Volume 28, Issue 8, Pages 2560–2563 (Mi ftt550)

Short Notes

Effect of the total internal reflection of X-rays on the secondary emission yield

M. V. Kruglov, I. K. Solomin

UDC: 539.36

Received: 13.02.1986

Fulltext: PDF file (505 kB)

Bibliographic databases: