Dielectric properties of $\mathrm{Si},\mathrm{Ge}$ and $\mathrm{GaAs}$ in the submillimeter range

B. P. Gorshunov, V. P. Kalinushkin, G. V. Kozlov, O. I. Sirotinskii

General Physics Institute of the Academy of Sciences of the USSR, Moscow

UDC: 535.32+535.34.546.289

Received: 02.02.1989

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