RUS
ENG
Full version
JOURNALS
// Fizika Tverdogo Tela
// Archive
Fizika Tverdogo Tela,
1986
Volume 28,
Issue 9,
Pages
2597–2603
(Mi ftt562)
Direct measurement of the parameters of x-ray dynamic scattering by silicon crystals at elevated temperatures
G. A. Dilbaryan
,
I. L. Smol'skii
,
V. N. Rozhanskii
Institute of Cristallography of the USSR Academy of Sciences, Moscow
UDC:
548.732
Received:
05.11.1985
Fulltext:
PDF file (3290 kB)
Bibliographic databases:
©
Steklov Math. Inst. of RAS
, 2024