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JOURNALS
// Fizika Tverdogo Tela
// Archive
Fizika Tverdogo Tela,
1986
Volume 28,
Issue 1,
Pages
322–324
(Mi ftt63)
Short Notes
Determination of photoemission formation depth by the X-ray dynamic scattering effect technique
M. V. Kruglov
,
I. K. Solomin
,
A. V. Lunev
UDC:
534.16
Received:
09.08.1984
Revised:
03.07.1985
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Steklov Math. Inst. of RAS
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