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JOURNALS
// Fizika Tverdogo Tela
// Archive
Fizika Tverdogo Tela,
1991
Volume 33,
Issue 7,
Pages
2221–2222
(Mi ftt6979)
Short Notes
X-ray diffraction study of
$\mathrm{Si}$
–
$\mathrm{NaNO}_{2}$
interface
P. A. Aleksandrov
,
A. A. Nefedov
,
V. A. Chaplanov
,
S. S. Yakimov
I. V. Kurchatov Institute of Atomic Energy
Received:
16.12.1990
Fulltext:
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Steklov Math. Inst. of RAS
, 2024