Oval defects in MBE-grown submicron layers of $\mathrm{GaAs}$ and $\mathrm{AlGaAs}$

A. V. Buyanov, E. P. Laurs, G. P. Peka, E. M. Semashko, V. N. Tkachenko

Production Association Kyiv Radio Plant, Academy of Sciences of the Ukrainian SSR

UDC: 621.385.833

Received: 04.01.1991
Revised: 30.05.1991

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