M. D. Volnyanskii, A. Yu. Kudzin, I. L. Chertkov, “Using the internal friction method to study defects in $\mathrm{Cr}$-doped and $\mathrm{Al}$-doped $\mathrm{Bi}_{12}\mathrm{SiO}_{20}$”, Fizika Tverdogo Tela, 1992, Volume 34, Issue 1,Pages 225

Using the internal friction method to study defects in $\mathrm{Cr}$-doped and $\mathrm{Al}$-doped $\mathrm{Bi}_{12}\mathrm{SiO}_{20}$

M. D. Volnyanskii, A. Yu. Kudzin, I. L. Chertkov

Dnepropetrovsk State University

UDC: 528.951—405

Received: 12.06.1991