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Fizika Tverdogo Tela, 2021 Volume 63, Issue 9, Pages 1372–1375 (Mi ftt8045)

This article is cited in 1 paper

XXV International Symposium Nanophysics and Nanoelectronics, Nizhny Novgorod, March 9-12, 2021
Surface physics, thin films

Evaluation of the single-photon detector characteristics depending on the parameters of a W$_x$S$_{(i-x)}$ superconducting film

S. Yu. Hydyrova, I. A. Stepanov, D. D. Vasilev, K. M. Moiseev

Bauman Moscow State Technical University, Moscow, Russia

Abstract: The absorption efficiency, cut-off wavelength, and recovery time of a superconducting nanowire single-photon detector were calculated as functions of the surface resistance Rs and the critical temperature $T_c$ of the W$_x$S$_{(i-x)}$ film. The calculated dependences for the SNSPD on W$_x$S$_{(i-x)}$ films show that films with $T_c$ > 3.5 K and 300 < $R_c$ < 420 $\Omega$/sq will provide $\eta_{\mathrm{abs}}\approx15\dots$ 20%, $\eta_{\mathrm{IDE}}$=100% at a wavelength of 1550 nm and the recovery time $\tau$ < 40 ns, which corresponds to the possible SNSPD count rate $CR_{\mathrm{max}}$ = 25 MHz.

Keywords: detector efficiency, detector count rate, W$_x$S$_{(i-x)}$ thin film, sheet resistance, critical temperature, superconductivity, sensitive element.

Received: 09.04.2021
Revised: 09.04.2021
Accepted: 19.04.2021

DOI: 10.21883/FTT.2021.09.51268.29H


 English version:
Physics of the Solid State, 2021, 63:9, 1410–1413

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© Steklov Math. Inst. of RAS, 2024