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JOURNALS // Fizika Tverdogo Tela // Archive

Fizika Tverdogo Tela, 2021 Volume 63, Issue 4, Pages 554–558 (Mi ftt8157)

This article is cited in 1 paper

Surface physics, thin films

Electrophysical properties along the interface of two polymer films of polymethylmethacrylate

A. N. Lachinovab, G. R. Altynshinaa, G. Sh. Baibulovab, M. F. Kianb, A. R. Yusupovb

a Institute of Molecule and Crystal Physics, Ufa Federal Research Centre, Russian Academy of Sciences, Ufa, Russia
b Bashkir State Pedagogical University, Ufa, Russia

Abstract: In this paper, the conductivity along the interface of two dielectric films of submicron thickness has been studied. The results of a comparative study of the electrophysical properties of individual films are presented. A commercial polymer, polymethyl methacrylate, was used as a dielectric material. The studies were carried out according to a two-probe scheme by the method of current-voltage characteristics. An abnormal increase in conductivity with respect to the volume was observed. It was found that the increase in conductivity is associated with an increase in the mobility of charge carriers along the interface to 140 cm$^2$/V$\cdot$s. A comparison is made with analogues known from other references; the need for additional analysis of the properties of a three- dimensional / two-dimensional area contact is emphasized.

Keywords: polymethyl methacrylate, dielectric films, interface, mobility.

Received: 21.12.2020
Revised: 23.12.2020
Accepted: 23.12.2020

DOI: 10.21883/FTT.2021.04.50724.266


 English version:
Physics of the Solid State, 2021, 63:4, 577–581

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© Steklov Math. Inst. of RAS, 2024