Abstract:
The frequency dependences of the dielectric loss tangent tan $\delta(f)$ and the Cole–Cole diagrams of silver sulfide thin films are studied at various temperatures in the range 0–200$^{\circ}$C. The experimental data are compared to the calculation of the complex impedance of the electric circuit proposed for Ag$_2$S-containing samples before and after the temperature semiconductor–superionic phase transition. A microscopic model of the phase transition in Ag$_2$S is proposed on the base of the analysis of obtained results and literature data.