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JOURNALS // Fizika Tverdogo Tela // Archive

Fizika Tverdogo Tela, 2020 Volume 62, Issue 11, Pages 1822–1827 (Mi ftt8248)

This article is cited in 6 papers

Semiconductors

Forming a type-II heterojunction in the InAsSb/InAsSbP semiconductor structure

V. V. Romanov, E. V. Ivanov, K. D. Moiseev

Ioffe Institute, St. Petersburg

Abstract: The results of studying the electroluminescent and current-voltage characteristics of the $n$-InAs/$n$-InAsSb/$p$-InAsSbP heterostructure grown by gas-phase epitaxy from organometallic compounds are presented. Intense electroluminescence was detected in the spectral range 0.23–0.29 eV at the temperature $T$ = 77 K. The position of the maximum of the main emission band ($h\nu\sim$ 0.24 eV) showed a noticeable “blue” shift with increasing applied forward bias. Based on the performed studies, it was concluded that there is a staggered type II heterojunction at the InAs$_{0.84}$Sb$_{0.16}$/InAs$_{0.32}$Sb$_{0.28}$P$_{0.40}$ heterointerface, which is confirmed by the results of the calculation of the energy band diagram.

Keywords: heterojunction, MOVPE, electroluminescence, I–V characteristics, antimonides, InAs.

Received: 26.06.2020
Revised: 26.06.2020
Accepted: 30.06.2020

DOI: 10.21883/FTT.2020.11.50055.139


 English version:
Physics of the Solid State, 2020, 62:11, 2039–2044

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© Steklov Math. Inst. of RAS, 2024