RUS  ENG
Full version
JOURNALS // Fizika Tverdogo Tela // Archive

Fizika Tverdogo Tela, 2020 Volume 62, Issue 6, Pages 960–964 (Mi ftt8412)

This article is cited in 6 papers

Surface physics, thin films

Experimental study of the thermal conductivity of single-walled carbon nanotube-based thin films

I. A. Tambasova, A. S. Voroninbc, N. P. Evsevskayad, Yu. M. Kuznetsove, A. V. Lukyanenkoac, E. V. Tambasovaf, M. O. Gornakova, M. V. Dorokhine, Yu. Yu. Loginovf

a L. V. Kirensky Institute of Physics, Siberian Branch of the Russian Academy of Sciences, Krasnoyarsk
b Krasnoyarsk Scientific Center of SB RAS
c Siberian Federal University, Krasnoyarsk
d Institute of Chemistry and Chemical Technology SB RAS, Krasnoyarsk
e Scientific-Research Physicotechnical Institute at the Nizhnii Novgorod State University, Nizhnii Novgorod
f M. F. Reshetnev Siberian State University of Science and Technologies

Abstract: The single-walled carbon nanotube-based thin films with a thickness from 11 $\pm$ 3 to 157 $\pm$ 18 nm have been formed using vacuum filtration. The thermal conductivity of the thin films as a function of thickness and temperature up to 450 K has been studied by the 3$\omega$ technique. It has been found that, in the region of 49 nm, the supplied heat from a gold strip started propagating with the high efficiency to the thin film plane. The thermal conductivity of the thin films with a thickness of 49 $\pm$ 8 nm was measured using the 3$\omega$ technique for bulk samples. It has been found that the thermal conductivity of the single-walled carbon nanotube-based thin films strongly depends on their thickness and temperature. The thermal conductivity sharply (by a factor of $\sim$ 60) increases with an increase in thickness from 11 $\pm$ 3 to 65 $\pm$ 4 nm. In addition, it has been observed that the thermal conductivity of the thin film with a thickness of 157 $\pm$ 18 nm rapidly decreases from 211 $\pm$ 11 to 27.5 $\pm$ 1.4 W m$^{-1}$ K$^{-1}$ at 300 and 450 K, respectively.

Keywords: single walled carbon nanotubes, vacuum filtration, thin films, thermal conductivity.

Received: 11.11.2019
Revised: 21.01.2020
Accepted: 21.01.2020

DOI: 10.21883/FTT.2020.06.49358.625


 English version:
Physics of the Solid State, 2020, 62:6, 1090–1094

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2024