RUS  ENG
Full version
JOURNALS // Fizika Tverdogo Tela // Archive

Fizika Tverdogo Tela, 2020 Volume 62, Issue 4, Pages 635–639 (Mi ftt8459)

This article is cited in 1 paper

Thermal properties

Specifics of heat transfer in Al$_{x}$Ga$_{1-x}$N/GaN heterostructures on sapphire

D. A. Chernodubov, I. O. Mayboroda, M. L. Zanaveskin, A. V. Inyushkin

National Research Centre "Kurchatov Institute", Moscow

Abstract: The thermal conductivity of Al$_{x}$Ga$_{1-x}$N/GaN heterostructures (0.05 $\le x\le$ 1) fabricated on sapphire by molecular beam epitaxy is measured. The thermal conductivities of thin Al$_{x}$Ga$_{1-x}$N and GaN films at room temperature are found. We analyze the concentration dependence of thermal conductivity using a virtual crystal model for thermal conductivity. A numerical model with a localized heat source is built to model heat transfer in the considered structure, and the layer thicknesses optimal for achieving a high thermal conductivity of the structure of interest are identified.

Keywords: thermal conductivity, gallium nitride, aluminium nitride, sapphire, 3-omega thermal conductivity measurement method.

Received: 14.11.2019
Revised: 14.11.2019
Accepted: 28.11.2019

DOI: 10.21883/FTT.2020.04.49154.628


 English version:
Physics of the Solid State, 2020, 62:4, 722–726

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2024