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Fizika Tverdogo Tela, 2019 Volume 61, Issue 12, Page 2446 (Mi ftt8591)

This article is cited in 2 papers

International Conference ''Mechanisms and Nonlinear Problems of Nucleation, Growth of Crystals and Thin Films'' dedicated to the memory of the outstanding theoretical physicist Professor V.V. Slezov (Proceedings) St. Petersburg, July 1-5, 2019
Surface physics and thin films

Impurity effects on nucleation and growth of SiC clusters and layers on Si(100) and Si(111)

J. Pezoldta, M. N. Lubovb, V. S. Kharlamovc

a Institut für Mikro- und Nanotechnologien, Technische Universität Ilmenau, Ilmenau, Germany
b Saint Petersburg Academic University, St. Petersburg, Russian Federation
c A.F. Ioffe Physical-Technical Institute of RAS, St. Petersburg, Russian Federation

Abstract: A kinetic Monte Carlo model of silicon carbide growth on silicon surface is proposed. Based on this model, the growth of silicon carbide clusters on silicon in the presence of a pre-deposited impurity of various types: attractive and repulsive, is studied. The density of silicon carbide clusters on silicon is calculated. Calculations of the dependencies of the silicon carbide clusters density on the impurity mobility are carried out. The process of redistribution of the species in the multi-component C|Ge|Si structure during annealing is studied in the framework of the kinetic approach. Concentration profiles of the structure components are determined.

Keywords: silicon surface, silicon carbide, interface, impurity, kinetic Monte Carlo, rate equation.

Received: 16.07.2019
Revised: 16.07.2019
Accepted: 16.07.2019

Language: English


 English version:
Physics of the Solid State, 2019, 61:12, 2468–2472

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