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Fizika Tverdogo Tela, 2019 Volume 61, Issue 7, Pages 1362–1367 (Mi ftt8768)

This article is cited in 1 paper

Surface physics, thin films

Interface localization of the Wannier–Mott exciton in the organic-semiconductor structure “Langmuir film/CdS”

K. A. Korolkovaa, V. R. Novakb, A. V. Sel'kinac

a Ioffe Institute, St. Petersburg
b NT-MDT Spectrum Instruments Ltd., 124460, Moscow, Russia
c Saint Petersburg State University

Abstract: The low-temperature ($T$ = 2 K) light reflectance spectra of organic semiconductor structures produced by depositing Langmuir–Blodgett films on a cadmium sulfide (CdS) crystal surface are studied. The spectra were studied in the region of the resonant frequency of the exciton state $A_{n = 1}$ in CdS. The spectra were analyzed within a multilayer medium model with allowance for the spatial dispersion and an exciton-free “dead” layer near the crystal surface contacting with the film. A conclusion is made that, as a result of the deposition of an organic film on a semiconductor crystal surface, the Wanier–Mott exciton is spatially localized near the film–crystal interface.

Received: 22.02.2019
Revised: 22.02.2019
Accepted: 26.02.2019

DOI: 10.21883/FTT.2019.07.47852.390


 English version:
Physics of the Solid State, 2019, 61:7, 1304–1309

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