Formation of a domain structure in multilayer CoPt films by magnetic probe of an atomic force microscope

A possibility of changing the magnetic type structure of multilayer CoPt films under action of the magnetic field of the atomic force microscope probe is demonstrated. A new method of non-contact magnetic-force measurements based on artificial increase in the electrostatic interaction between the probe and the film is proposed. This method enables one to controllably change the distance between a probe and a film, thus changing the strength of the magnetic interaction. Using it, one can create from a uniformly magnetized state both a labyrinth domain structure and isolated domains, which are apparently magnetic skyrmions.