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Fizika Tverdogo Tela, 2018 Volume 60, Issue 3, Pages 547–552 (Mi ftt9277)

This article is cited in 5 papers

Ferroelectricity

Effect of the crystal structure on the electrical properties of thin-film PZT structures

L. A. Delimovaa, E. V. Gushchinaa, N. V. Zaitsevaa, D. S. Sereginb, K. A. Vorotilovb, A. S. Sigovb

a Ioffe Institute, St. Petersburg
b MIREA — Russian Technological University, Moscow

Abstract: A new method of two-stage crystallization of lead zirconate–titanate (PZT) films using a seed sublayer with a low excess lead content has been proposed and realized. A seed layer with a strong texture of perovskite Pe(111) grains is formed from a solution with a lead excess of 0–5 wt %; the fast growth of the grains is provided by the deposition of the main film from a solution with high lead content. As a result, a strong Pe(111) texture with complete suppression of the Pe(100) orientation forms. An analysis of current–voltage dependences of the transient currents and the distributions of the local conductivity measured by the contact AFM method reveals two various mechanisms of current percolation that are determined by traps in the bulk and at the perovskite grain interfaces.

Received: 21.09.2017

DOI: 10.21883/FTT.2018.03.45560.269


 English version:
Physics of the Solid State, 2018, 60:3, 553–558

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