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Fizika Tverdogo Tela, 2018 Volume 60, Issue 2, Pages 383–389 (Mi ftt9316)

Low dimensional systems

Anomalous dependence of the intensity of X-ray reflections of Cs$_{2}$SO$_{4}$ on the crystallite size and shape

I. M. Shmyt'ko, V. V. Kedrov, A. S. Aronin

Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Moscow region

Abstract: Detailed X-ray and electron microscopy analyses of Cs$_{2}$SO$_{4}$ powders consisting of sphere- and platelike crystallites have been carried out. It is established that the intensity distributions of X-ray reflections in both cases radically differ, with the position on the diffraction-angle axis retained in accordance with the PDF-2 database. Electron microscopy microdiffraction investigations of the orientation of developed surfaces of platelike crystallites revealed four different directions; however, these directions could not provide texture amplification of a number of observed $(hkl)$ reflections. It is suggested that the intensity redistribution is based on the sphericity of X-ray waves incident on the sample.

Received: 18.07.2017

DOI: 10.21883/FTT.2018.02.45397.240


 English version:
Physics of the Solid State, 2018, 60:2, 390–396

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© Steklov Math. Inst. of RAS, 2024