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Fizika Tverdogo Tela, 2017 Volume 59, Issue 11, Pages 2203–2205 (Mi ftt9402)

This article is cited in 6 papers

XX International Symposium "Nanophysics and Nanoelectronics", Nizhny Novgorod, March 13-16, 2017
Surface Physics, Thin Films

Photoconductive detector of circularly polarized radiation based on a MIS structure with a CoPt layer

A. V. Kudrinab, M. V. Dorokhinab, A. V. Zdoroveyshchevba, P. B. Deminab, O. V. Vikhrovab, I. L. Kalentyevab, M. V. Vedab

a Lobachevsky State University of Nizhny Novgorod
b Scientific-Research Physicotechnical Institute at the Nizhnii Novgorod State University, Nizhnii Novgorod

Abstract: A photoconductive detector of circularly polarized radiation based on the metal–insulator–semiconductor structure of CoPt/(Al$_{2}$O$_{3}$/SiO$_{2}$/Al$_{2}$O$_{3}$)/InGaAs/GaAs is created. The efficiency of detection of circularly polarized radiation is 0.75% at room temperature. The operation of the detector is based on the manifestation of the effect of magnetic circular dichroism in the CoPt layer, that is, the dependence of the CoPt transmission coefficient on the sign of the circular polarization of light and magnetization.

DOI: 10.21883/FTT.2017.11.45062.17k


 English version:
Physics of the Solid State, 2017, 59:11, 2223–2225

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