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Fizika Tverdogo Tela, 2017 Volume 59, Issue 7, Pages 1413–1417 (Mi ftt9534)

This article is cited in 4 papers

Surface physics, thin films

Effect of the pH of solutions on the coercivity and microstructure of chemically deposited CoP cilms

A. V. Chzhanab, S. A. Podorozhnyakb, M. N. Volochaevc, G. N. Bondarenkod, G. S. Patrinbc

a Krasnoyarsk State Agricultural University
b Siberian Federal University, Krasnoyarsk
c L. V. Kirensky Institute of Physics, Siberian Branch of the Russian Academy of Sciences, Krasnoyarsk
d Institute of Chemistry and Chemical Technology SB RAS, Krasnoyarsk

Abstract: Specific features of the variation in the microstructure and coercivity $H_C$ of chemically deposited CoP films with the pH of the solutions are determined. It is established that around pH $\sim$ 8.5, the film undergoes the structural transition from the submicrocrystalline to nanocrystalline state, which is followed by the transition from the crystalline to amorphous phase. It is demonstrated that the observed transition is not accompanied by the change in the crystallographic structure and is caused by a decrease in the geometrical sizes due to embedding of P atoms. It is found that the CoP films fabricated at pH $\sim$ 8.5 have the properties characteristic of compact nanocrystalline materials.

Received: 20.12.2016

DOI: 10.21883/FTT.2017.07.44607.449


 English version:
Physics of the Solid State, 2017, 59:7, 1440–1445

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