Abstract:
The azimuthal anisotropy of the linear and nonlinear magnetooptical Kerr effect has been studied for a structure that is an ordered array with 420-nm-diameter pores in a 30-nm-thick permalloy film on a silicon substrate. The azimuthal anisotropy of the magnetooptical Kerr effect and the coercive force, corresponding to 4 m symmetry of a planar nanopore array, has been established experimentally. The measurements are accompanied with the numerical calculation of the anisotropic magnetization distribution in the structure at different orientations of the applied magnetic field.