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Fizika Tverdogo Tela, 2016 Volume 58, Issue 5, Pages 1011–1018 (Mi ftt9994)

This article is cited in 17 papers

Surface physics, thin films

Effect of interaction in the Ga–As–O system on the morphology of a GaAs surface during molecular-beam epitaxy

O. A. Ageev, S. V. Balakirev, M. S. Solodovnik, M. M. Eremenko

Institute of Nanotechnologies, Electronics and Equipment Engineering

Abstract: A thermodynamic analysis of processes of interphase interaction in the Ga–As–O system has been performed and their theoretical laws have been determined, taking into account nonlinear thermal physical properties of the compounds, the oxide film compositions, and modes of molecular-beam epitaxy of GaAs. The processes of interaction of the native oxide of GaAs with the substrate material and also with Ga and As$_4$ from a vapor gaseous phase have been studied experimentally. The experimental results correlate with the results of the thermodynamic analysis. The laws of influence of the removal of the proper oxide on the evolution of the GaAs surface morphology under conditions of the molecular-beam epitaxy have been proposed.

Keywords: GaAs, Oxide Film, GaAs Surface, Gallium Oxide, RHEED Pattern.

Received: 18.08.2015


 English version:
Physics of the Solid State, 2016, 58:5, 1045–1052

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