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JOURNALS // Informatika i Ee Primeneniya [Informatics and its Applications] // Archive

Inform. Primen., 2021 Volume 15, Issue 4, Pages 65–71 (Mi ia758)

This article is cited in 1 paper

The electronic component base of failure resilience digital circuits

I. A. Sokolova, Yu. A. Stepchenkova, Yu. G. Diachenkoa, Yu. V. Rogdestvenskia, A. N. Kamenskihb

a Federal Research Center “Computer Science and Control” of the Russian Academy of Sciences, 44-2 Vavilov Str., Moscow 119333, Russian Federation
b Perm National Research Polytechnic University, 29 Komsomol Prosp., Perm 614990, Russian Federation

Abstract: The article presents the research of self-timed and synchronous circuits in terms of resilience to soft errors which can cause disruptions in the control system's operation of complex technical device. The use of a fail-resilient self-timed code is proposed, which considers the antispacer state as the second spacer state. This approach increases the self-timed circuit's failure resilience level. In the first approximation, quantitative estimates show that the self-timed pipeline has a better failure resilience than the synchronous counterparts by 2.0–4.7 times. The use of modified C-element to implement the pipeline register bit increases this advantage to 2.2–5.4 times. Due to this, self-timed circuits are the preferred basis of failure resilient control systems implementation for complex technical equipment.

Keywords: synchronous circuits, self-timed circuits, soft error, failure resilience, pipeline, transition completion indication, probability evaluation.

Received: 19.09.2021

DOI: 10.14357/19922264210409



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