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JOURNALS // Itogi Nauki i Tekhniki. Sovremennaya Matematika i ee Prilozheniya. Tematicheskie Obzory // Archive

Itogi Nauki i Tekhniki. Sovrem. Mat. Pril. Temat. Obz., 2023 Volume 224, Pages 89–96 (Mi into1175)

Two sequential test schemes with aftereffect

N. A. Kolokol'nikova

Irkutsk State University

Abstract: Two variants of the urn scheme with aftereffect are described. Using $\mathrm{A}$- and $\Phi$-schemes of sequential tests, we find an explicit distribution of the number of removed balls of a certain color, obtain numerical characteristics of the distribution, and prove limit theorems.

Keywords: urn scheme, $\mathrm{A}$-scheme of sequential tests, $\Phi$-scheme of sequential tests, probability, distribution, limit theorem.

UDC: 519.1, 519.2

MSC: 60Е05, 60С05, 60Е10

DOI: 10.36535/0233-6723-2023-224-89-96



© Steklov Math. Inst. of RAS, 2024