On the well-posedness of mathematical models of diffusion due to a sharply focused electron probe in a homogeneous semiconductor material

In this paper, we compare qualitative properties of two- and three-dimensional mathematical models of the diffusion of particles (nonequilibrium minority charge carriers, excitons) generated by a sharply focused electron probe in a homogeneous semiconductor material. We show that the mathematical models considered are well posed and can be used for estimating electrophysical parameters of homogeneous semiconductor targets based on the results of experimental measurements.