K. A. Popkov, “Lower bounds on lengths of complete diagnostic tests for circuits and inputs of circuits”, Keldysh Institute preprints, 2016,060, 12 pp.

This article is cited in 2 papers

Lower bounds on lengths of complete diagnostic tests for circuits and inputs of circuits

K. A. Popkov

Abstract: Exponential lower bounds on lengths of the following tests are obtained:

complete diagnostic tests in presence of one-type or arbitrary constant faults on inputs of circuits;
complete diagnostic tests for logic circuits in some bases in presence of one-type or arbitrary constant faults on outputs of gates.

Keywords: logic circuit, fault, complete diagnostic test, test for inputs of circuits.

DOI: 10.20948/prepr-2016-60