Abstract:
Using atomic force microscopy investigated the surface morphology of composite films HDPE's GaAs and HDPE's GaAs <Te >(x = 1-10 mass%). It was shown that the modification of the surface topography of composite films depends on the type and concentration of filler introduced. It was found that the values of x = 2-6 mass% is structuring the surface with a maximum degree of crystallinity.
Keywords:composite film, atomic force microscopy (AFM), three-dimensional images (3D), histogram.