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JOURNALS // Meždunarodnyj naučno-issledovatel'skij žurnal // Archive

Meždunar. nauč.-issled. žurn., 2015 Issue 6-2(37), Pages 8–11 (Mi irj204)

PHYSICS AND MATHEMATICS

A microscopic study of the surface topography of composites based on high density polyethylene and fillers GaAs and GaAs<TE>

M. I. Alieva, N. N. Gadzhievab, G. B. Ahmadovaa

a Institute of Physics Azerbaijan Academy of Sciences
b Institute of radiation problems, ANAS

Abstract: Using atomic force microscopy investigated the surface morphology of composite films HDPE's GaAs and HDPE's GaAs <Te >(x = 1-10 mass%). It was shown that the modification of the surface topography of composite films depends on the type and concentration of filler introduced. It was found that the values of x = 2-6 mass% is structuring the surface with a maximum degree of crystallinity.

Keywords: composite film, atomic force microscopy (AFM), three-dimensional images (3D), histogram.



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