Electron microscopic images analysis using spectral characteristics

The methods of image analysis and modeling of nanostructures using the integral spectral characteristics of orthogonal transformations of images were introduced. Also the Various methods of calculating the integral of the frequency (CFC) and spatial (TOC) on the characteristics of generalized spectra were examine. transformation is modified in accordance with the features of the IFC and the TOC transform spectrum for modeling the distribution of images modules amplitudes orthogonal and the required form of the modified integral spectral characteristics. Next in the article, the techniques of modeling images with a given periodogram correlation function, fractal spectrum fractal IFC isotropic TOC is demonstrate. Moreover methods, algorithms and software tools which allow to the primary processing of images was developed to identify the correlation and spectral characteristics of the microstructure and eliminate distortions associated with the blurring, smearing and defocusing.