Evaluating fractal properties of nanostructures from microscopic images

The article investigates a method for analyzing fractal properties of images based on their structural function and proposesan extension of this method in order to analyze local fractal features. The authors investigate a method for synthesizing imageswith spectral self-similarity properties and propose a method for modifying images into fractal ones with a self-similar structuralfunction based on wavelet transformations. Also, the authors introduce a software tool for fractal analysis of microscopic imagesusing the methods featured in the study. The effectiveness of these methods is shown by means of their verification on modeledfractal images. The study proposes the application of the developed fractal analysis tools in the field of electron and opticalmicroscopy.