M. A. Lopunov, “On checking tests with respect to local permutations of circuit inputs”, Intelligent systems. Theory and applications, 2021, Volume 25, Issue 4,Pages <nobr>153

Part 2. Mathematics and Computer Science

On checking tests with respect to local permutations of circuit inputs

M. A. Lopunov

Lomonosov Moscow State University

Abstract: The paper establishes the order of growth of the Shannon function of the length of the checking test relative to the source of faults, which can arbitrarily swap any k of consecutive inputs of the circuit.

Keywords: checking test, tests on circuit inputs, Shannon function, permutations.